Article title |
Year |
Self-heating-induced junctionless stacked nanosheet FET RF stability performance degradation analysis and optimization
M Balasubbareddy, K Sivasankaran, AE Atamuratov, MM Khalilloev Journal of Computational Electronics 24 (5), 144, | 2025 |
Self-Heating Effects in Nanoscale MOSFETs
A Yusupov, A Atamuratov, M Khalilloev IntechOpen, | 2025 |
Impacts of Local Oxide Trapped Charge on Electrical and Capacitance Characteristics of SOI FinFet
A Atamuratov, I Karimov, M Foziljonov, A Abdikarimov, O Atamuratov, ... East European Journal of Physics, 357-364, | 2025 |
Effect of Gate Oxide and Back Oxide Materials on Self-Heating Effect in FinFET
MM Khalilloev, BO Jabbarova, F Eshchanov, AE Atamuratov East European Journal of Physics, 253-356, | 2025 |
Investigation of the Behavior of Nickel Impurity Atoms in the Silicon Lattice Based on First Principles
BK Ismaylov, KA Ismailov, NF Zikrillaev, AE Atamuratov, SV Koveshnikov, ... East European Journal of Physics, 442-448, | 2025 |
Impact of source (drain) doping profiles and channel doping level on self-heating effect in FinFET
AE Atamuratov, BO Jabbarova, MM Khalilloev, DR Rajapov, A Yusupov, ... Micro and Nanostructures 197, 208015, | 2025 |
Influence of the Gate Oxide and Back Oxide Material Types on Self-heating Effect in Junctionless FinFET
A Atamuratov, B Jabbarova, M Khalilloev, A Yusupov, K Sivasankaran IEEE 25th International Conference of Young Professionals in Electron …, | 2024 |
Simulation study of short channel effects in junctionless SOI MOSFETS
M Khalilloev arXiv preprint arXiv:2402.14900, | 2024 |
Comparative study of the self-heating effect in the accumulation and inversion mode FinFETs
AE Atamuratov, BO Jabbarova, ES Xaitbayev, DR Rajapov, MM Khalilloev arXiv preprint arXiv:2402.10858, | 2024 |
Optimization of vertically stacked nanosheet FET immune to self-heating
M Balasubbareddy, K Sivasankaran, AE Atamuratov, MM Khalilloev Micro and Nanostructures 182, 207633, | 2023 |
Impact of the channel shape, back oxide and gate oxide layers on self-heating in nanoscale JL FINFET
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov, ... Наносистемы: физика, химия, математика 13 (2), 148-155, | 2022 |
The self-heating effect in junctionless fin field-effect transistors based on silicon-on-insulator structures with different channel shapes
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov Technical Physics Letters 47 (7), 542-545, | 2021 |
Self-heating effect in nanoscale SOI Junctionless FinFET with different geometries
AE Atamuratov, BO Jabbarova, MM Khalilloev, A Yusupov, AG Loureriro 13th Spanish Conference on Electron Devices (CDE), 62-65, | 2021 |
Amplitude of Random Telegraph Noise in Junctionless FinFET with Different Channel Shape
AE Atamuratov, MM Khalilloev, A Yusupov, JC Chedjou, K Kyamakya e-Journal of Surface Science and Nanotechnology 19, 9-12, | 2021 |
Contribution to the Physical Modelling of Single Charged Defects Causing the Random Telegraph Noise in Junctionless FinFET
AE Atamuratov, MM Khalilloev, A Yusupov, AJ García-Loureiro, ... Applied Sciences 10 (15), 5327, | 2020 |
The Influence of Fin Shape on the Amplitude of Random Telegraph Noise in the Subthreshold Regime of a Junctionless FinFET
M.M.Khalilloeva, B.O.Jabbarova, A.A.Nasirov Technical Physics Letters 45 (1063-7850), pp. 1245–1248., | 2019 |
Влияние формы канала на амплитуду случайных телеграфных шумов в подпороговой области беспереходного FinFET-транзистора
М.M.Халиллоев, Б.О.Жаббарова, А.А.Насиров Письма в ЖТФ 45, вып. 24, | 2019 |
The Influence of Fin Shape on the Amplitude of Random Telegraph Noise in the Subthreshold Regime of a Junctionless FinFET
AAN M. M. Khalilloeva*, B. O. Jabbarova Technical Physics Letters 45 (1063-7850), pp. 1245–1248., | 2019 |
Simulation of DIBL effect and sub-threshold swing in low power junctionless MOSFETs with different geometries
M Khalilloev, A Atamuratov, A Yusupov Applied Science, Biofuels & Petroleum Engineering 5, 1, | 2018 |
Simulation of DIBL effect in junctionless SOI MOSFETs with extended gate
AE Atamuratov, M Khalilloev, A Abdikarimov, ZA Atamuratova, M Kittler, ... Наносистемы: физика, химия, математика 8 (1), | 2017 |
Simulation of DIBL effect in 25 nm SOI-FinFET with the different body shapes
AE Atamuratov, A Abdikarimov, M Khalilloev, ZA Atamuratova, ... Наносистемы: физика, химия, математика 8 (1), | 2017 |
The lateral capacitance of nanometer mnosfet with a single charge trapped in oxide layeror at SiO2-Si3N4 interfaceat
E Atamuratov, UA Aminov, ZA Atamuratova, M Halillaev, A Abdikarimov, ... Наносистемы: физика, химия, математика 6 (6), 837-842, | 2015 |
USING COMSOL MULTIPHYSICS TO STUDY THE EFFECT OF MOSFET GATE DIELECTRIC THICKNESS AND EXTERNAL TEMPERATURE ON ITS OUTPUT CHARACTERISTICS
D Rajapov, A Khasanov, E Khaitbayev, M Khalilloev Scientific committee, 108, 0 | |